Bayesian multilevel random‐effects model for estimating noise in image sensors
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چکیده
منابع مشابه
Noise in Sub-Micron CMOS Image Sensors Noise in Sub-Micron CMOS Image Sensors
PROEFSCHRIFT ter verkrijging van de graad van doctor aan de Technische Universiteit Delft, op gezag van de Rector Magnificus Prof.dr.ir. J.T. Fokkema, voorzitter van het College voor Promoties, in het openbaar te verdedigen op maandag 3 november om 15:00 uur. Het onderzoek beschreven in dit proefschrift in financieel ondersteund door de Stichting voor Technische Wetenschappen (STW). All rights ...
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ژورنال
عنوان ژورنال: IET Image Processing
سال: 2020
ISSN: 1751-9659,1751-9667
DOI: 10.1049/iet-ipr.2018.5926